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High accurate overlay alignment with FabSCIL module

    SCIL Nanoimprint Solutions again shows its leadership in NIL by achieving highly accurate front-to-back overlay alignment on its unique 300mm SCIL imprint module. By combining the SCIL imprint method, inorganic imprint materials and optimized processing, structures can be created with unsurpassed dimensional and optical properties (R.I.>2.0). This opens many opportunities in smart glasses, 3D sensing and other nanophotonic applications.

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